JIS C 61000-4-20:2014 電磁両立性―第4-20部:試験及び測定技術―TEM(横方向電磁界)導波管のエミッション及びイミュニティ試験 | ページ 13

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C 61000-4-20 : 2014
IEEE Std 1309-2005,IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding
Antennas, from 9 kHz to 40 GHz
IEEE Std 145-1993,IEEE Standard Definitions of Terms for Antennas
IEEE Std 211-1997,IEEE Standard Definitions of Terms for Radio Wave Propagation
MIL-STD 461F,Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and
Equipment
その他の参考文献
[1] M. Alexander, A. Nothofer, R.C. Dixon, “The use of ferrite clamps and clip-on ferrites”, CISPR/A-TC77
(JTF-TEM-Alexander-Nothofer-Dixon) 01-01, June 2001
[2] ANSI C63.4-2008,American National Standard for Methods of Measurement of Radio-Noise Emissions
from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz, The Institute of
Electrical and Electronics Engineers, Inc., New York, Dec. 2000
[3] T.M. Babij, “Evaluation of errors in the calibration of TEM cells”, IEEE Miami Technicon 87, Miami, FL,
pp. 199-201, 1987
[4] A. Beggio, G. Borio, and R.E. Zich, “On the unwanted effects on the radiated emission and susceptibility
measurements due to the introduction of a wooden table”, International Symposium on Electromagnetic
Compatibility, Tokyo, Japan, pp.252-255, May 1999
[5] S. Bentz, “Use of the TEM cell for compliance testing of emission and immunity, an IEC perspective”, IEEE
International Symposium on Electromagnetic Compatibility, Santa Clara, CA, pp. 43-47, 1996
[6] H.S. Berger, and A. Tsaliovich, “Unlicensed PCS product EMC compliance measurement rational and
alternatives”, IEEE International Symposium on Electromagnetic Compatibility, Santa Clara, CA, pp.
396-401, 1996
[7] J. van Bladel, Electromagnetic Fields, Hemisphere Publishing Corporation, 1985
[8] Ch. Braun, W. Graf, P. Guidi, H.U. Schmidt “Beeinflussung der Stromverteilung auf Testobjekten in
TEM-Wellenleitern bei Variation des Fllfaktors”, (translation: “Influence of current distribution on test
objects in TEM waveguides for variable object size”), Kleinheubach Symposium of URSI German NC and
ITG, Kleinheubacher Berichte, Deutsche Telekom, Darmstadt, Germany, vol. 39, 1996
[9] E.L. Bronaugh, “Simplifying EMI immunity (susceptibility) ests in TEM cells”, IEEE International
Symposium on Electromagnetic Compatibility, Washington, D.C., pp. 488-491, August 1990
[10] E. Bronaugh, and J. Osburn, “Radiated emissions test performance of the GHz TEM cell”, IEEE International
Symposium on Electromagnetic Compatibility, Cherry Hill, NJ, pp. 1-7, Aug. 1991
[11] CISPR 14 (all parts),Electromagnetic compatibility−Requirements for household appliances, electric tools
and similar apparatus
[13] R. E. Collin, Field Theory of Guided Waves, 2nd ed., IEEE Press, Piscataway, NJ, 1991
[14] M. Crawford, and J. Workman, “Predicting free-space radiated emissions from electronic equipment using
TEM cell and open-field site measurements”, IEEE International Symposium on Electromagnetic
Compatibility, Baltimore, MD, pp. 80-85, 1980
[15] H. Garbe, H. Haase, M. Koch, “Specification of alternative test sites with respect to given EMC field
standards”, International Zurich Symposium on Electromagnetic Compatibility, Zurich, Switzerland, pp.

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C 61000-4-20 : 2014
459-464, Feb. 1997
[16] J. Glimm, K. Mnter, M. Spitzer, Th. Dtzer, Th. Schrader, “Influence of calibration and measurement
techniques on the inhomogeneity of electromagnetic fields for immunity tests”, International Symposium on
Electromagnetic Compatibility, Tokyo, Japan, pp. 600-603, May 1999
[17] C. Groh, J.P. Kaerst, M. Koch, and H. Garbe, “TEM Waveguides for EMC measurements”, IEEE
Transactions on Electromagnetic Compatibility, vol. 41, no. 4, pp. 440-445, Nov. 1999
[18] C. Groh, J.P. Kaerst, and H. Garbe, “Einfluss der Beladung auf die Feldmoden in TEM Wellenleitern”,
(translation: “Influence of load on field modes in TEM waveguides”), Elektromagnetische Vertraeglichkeit
EMV 2000 (8. Intl. Symp. and Exhb. on EMC), VDE Verlag, Berlin, Germany, pp. 287-294, Feb. 2000, ISBN
3-8007-2522-3
[19] C. Groh, TEM Zellen zur Kalibration von elektromagnetischen Feldsensoren, (translation: TEM cells for
calibration of electromagnetic field probes), PhD-thesis, University of Hannover, Germany, VDE Verlag,
2002
[20] T.E. Harrington, Z. Chen, and M. D. Foegelle, “GTEM radiated emissions testing and FDTD modeling”,
IEEE International Symposium on Electromagnetic Compatibility, Seattle, WA, pp. 770-775, 1999
[21] T.E. Harrington, “Total-radiated-power-based OATS-equivalent emissions testing in reverberation chambers
and GTEM cells”, IEEE International Symposium on Electromagnetic Compatibility, Washington, DC, pp.
23-28, 2000
[22] T.E. Harrington, and E.L. Bronaugh, “EUT directivity and other uncertainty considerations for GHz-range
use of TEM waveguides”, IEEE International Symposium on Electromagnetic Compatibility, Montreal, QC,
Canada, pp. 117-122, 2001
[23] IEC 61000-2-9, Electromagnetic compatibility (EMC)−Part 2: Environment−Section 9: Description of
HEMP environment−Radiated disturbance
[24] IEEE Std 1309-2005: IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes,
Excluding Antennas, from 9 kHz to 40 GHz, The Institute of Electrical and Electronics Engineers, Inc., New
York, 1996
[25] J.P. Kaerst, C. Groh, and H. Garbe, “Field mode properties of loaded waveguides”, International Zurich
Symposium on Electromagnetic Compatibility, Zurich, Switzerland, pp. 481-486, Feb. 2001
[26] J.P. Kaerst, Qualifikation beladener TEM Wellenleiter, (translation: Validation of loaded TEM waveguides),
PhD-thesis, University of Hannover, Germany, VDE Verlag, 2002
[27] M. Klingler, J. Rioult, J.-P. Ghys, and S. Ficheux, “Wideband total radiated power measurements of
electronic equipment in TEM and GTEM cells”, International Zurich Symposium on Electromagnetic
Compatibility, Zurich, Switzerland, pp. 665-670, 1999
[28] M. Koch, Analytische Feldberechnung in TEM Zellen, (translation: Analytical Field Calculation in TEM
Cells"), PhD-thesis, University of Hannover, Shaker-Verlag, Aachen, Germany, 1999, ISBN 3-8265-6017-5
[29] G. Koepke, and M. Ma, “A new method to quantify the radiation characteristics of an unknown interference
source”, International Zurich Symposium on Electromagnetic Compatibility, Zurich, Switzerland, pp. 35-40,
March 1983
[30] M. Ma, and G. Koepke, Uncertainties in Extracting Radiation Parameters for an Unknown Interference
Source Based on Power and Phase Measurements, National Institute of Standards and Technology (NIST,

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C 61000-4-20 : 2014
formerly NBS), Technical Note 1064, June 1983
[31] A. Nothofer, A.C. Marvin, and J.F. Dawson, “Uncertainties due to cross-polar coupling in GTEM cell
emission measurement”, International Symposium on Electromagnetic Compatibility, Rome, Italy, pp.
590-595, 1998
[32] A. Nothofer, A.C. Marvin, and J.F. Dawson: “Indirect measurements of field uniformity in TEM cells
Including cross-polar field components”, International Zurich Symposium on Electromagnetic Compatibility,
Zurich, Switzerland, pp. 659-664, March, 1999
[33] D.M. Pozar, Microwave Engineering, 2nd ed., John Wiley & Sons, NY, 1998
[34] T. Schrader, Vergleich von Feldgeneratoren fr EMV-Prfungen, (translation: Comparison of Field
Generators for EMC Tests), PhD-thesis, University of Braunschweig, Germany, 1997
[35] I. Sreenivasiah, D. Chang, and M. Ma, “Emission characteristics of electrically small radiating sources from
tests inside a TEM cell”, IEEE Transactions on Electromagnetic Compatibility, vol. 23, no. 3, pp. 113-121,
Aug. 1981
[36] E. Steinke, P. Wilson, and H. Garbe, “An equivalent” radiated emission “voltage measurement standard for
TEM cells”, International Wroclaw Symposium on Electromagnetic Compatibility, Wroclaw, Poland, pp.
301-304, Sept. 1992
[37] M.J. Thelberg, E.L. Bronaugh, and J.D.M. Osburn, “GTEM to OATS radiated emissions correlation from 1-5
GHz,” IEEE International Symposium on Electromagnetic Compatibility, Chicago, IL, pp. 387-392, 1994
[38] J. Tippet, and D. Chang, “Radiation characteristics of electrically small devices in a TEM transmission cell”,
IEEE Transactions on Electromagnetic Compatibility, vol. 18, no. 4, pp. 134-140, Nov. 1976
[39] L. Turnbull, and A. Marvin, “A treatment of the phase properties of GTEM to open-area test-site correlation
techniques,” IEEE Transactions on Electromagnetic Compatibility, vol. 40, no. 1, pp. 62-69, Feb. 1998
[40] P. Wilson, D. Hansen, and D. Koenigstein, “Simulating open area test site emission measurements based on
data obtained in a novel broadband TEM cell”, IEEE National Symposium on Electromagnetic Compatibility,
Denver, CO, pp. 171-177, May 1989
[41] P. Wilson, “On correlating TEM cell and OATS emission measurements,” IEEE Transactions on
Electromagnetic Compatibility, vol. 37, no. 1, pp. 1-16, Feb. 1995
[43] CISPR/TR 16-4-1,Specification for radio disturbance and immunity measuring apparatus and methods−
Part 4-1: Uncertainties, statistics and limit modelling−Uncertainties in standardized EMC tests
[44] CISPR 16-4-2,Specification for radio disturbance and immunity measuring apparatus and methods−Part
4-2: Uncertainties, statistics and limit modelling−Uncertainty in EMC measurements
[45] CISPR/TR 16-4-3,Specification for radio disturbance and immunity measuring apparatus and methods−
Part 4-3: Uncertainties, statistics and limit modelling−Statistical considerations in the determination of EMC
compliance of mass-produced products
[46] CISPR/TR 16-4-4,Specification for radio disturbance and immunity measuring apparatus and methods−
Part 4-4: Uncertainties, statistics and limit modelling−Statistics of complaints and a model for the
calculation of limits for the protection of radio services
[47] J. Glimm, K. Mnter, R. Pape, T. Schrader, and M. Spitzer, “The New National Standard of EM Field
Strength; Realisation and Dissemination”, 12th Int. Symposium on EMC, February 18-20, 1997, Zurich,
Switzerland, ISBN 3-9521199-1-1, Page 611-613

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[48] H. Garn, M. Buchmayr, and W. Mullner, “Precise calibration of electric field sensors for radiated
susceptibility testing”, Frequenz 53 (1999) 9-10, Page 190-194
[49] IEEE Standard 1309-2005,for Calibration of Electromagnetic Field Sensors and Probes, Excluding
Antennas, from 9 kHz to 40 GHz, 2005
[50] TS Z 0033:2012 測定における不確かさの表現のガイド
注記 対応国際規格 : ISO/IEC Guide 98-3:2008,Uncertainty of measurement−Part 3: Guide to the
expression of uncertainty in measurement (GUM: 1995)(IDT)
[51] S. Ishigami and M. Hirata, “A New Calibration Method for an E-field Probe using TEM Waveguides”, The
20th International Zurich Symposium on Electromagnetic Compatibility (EMC Zurich 2009), January 2009
[52] BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML. Guide to the Expression of Uncertainty in Measurement.
International Organization for Standardization, Geneva, Switzerland, ISBN 92-67-10188-9, First Edition,
1993
[53] UKAS M3003 The Expression of Uncertainty and Confidence in Measurement, Ed.2, 2007
[54] J. Glimm, K. Mnter, R. Pape, T. Schrader, and M. Spitzer, “The New National Standard of EM Field
Strength; Realisation and Dissemination”, 12th Int. Symposium on EMC, February 18-20, 1997, Zurich,
Switzerland, ISBN 3-9521199-1-1, Page 611-613
[55] H. Garn, M. Buchmayr, and W. Mullner, “Precise calibration of electric field sensors for radiated
susceptibility testing”, Frequenz 53 (1999) 9-10, Page 190-194.
[56] J.Labus, “Rechnerische Ermittlung der Impedanz von Antennen. (Mathematical calculation of the impedance
of antennas) ochfrequenz und Elektroakustik, vol. 41, pp. 17-23; January, 1933

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附属書JA
(参考)
JISと対応国際規格との対比表
IEC 61000-4-20:2010 Electromagnetic compatibility (EMC)−Part 4-20: Testing and
JIS C 61000-4-20:2014 電磁両立性−第4-20部 : 試験及び測定技術−TEM(横方
向電磁界)導波管のエミッション及びイミュニティ試験 measurement techniques−Emission and immunity testing in transverse electromagnetic
(TEM) aveguides
(I) JISの規定 (II) (III)国際規格の規定 (IV) JISと国際規格との技術的差異の (V) JISと国際規格との技術的差異の理由
国際 箇条ごとの評価及びその内容 及び今後の対策
規格
箇条番号 内容 箇条 内容 箇条ごと 技術的差異の内容
番号
及び題名 番号 の評価
3 用語,定 3.1 削除
gravity-dependent/-independent gravity-dependent 対応国際規格において,当該用語が現れ
義及び略号 /-independentを削除。 る部分(附属書A)が削除されているの
で,この定義も削除した。今後の対策と
しては,対応国際規格審議団体である
CISPR/A +SC77B TEM-JTFへのエキスパ
ートとしての修正文書の提案,及び対応
国際規格の委員会原案等への国内委員会
からのコメントを行うことで対応する。
以降の項目についても同様とする。
5 TEM導波 5.2.1 at least one frequency 追加 “at least one frequency”に言
対応国際規格では,“試験周波数点数の最
管の要求事 葉を補った。 大5 %まで(一つの周波数以上)”となっ
項 ているが,これでは括弧内の記述が何を
意味しているか不明であり,また,この
文章の意味は,試験周波数点数の5 %が1
点に満たないような,試験点数の少ない
場合の説明であることから,“周波数点数
C6
が少ない場合は”という言葉を補った。
10
5.2.1 変更 周波数範囲は30 MHzから。 対応国際規格では30 MHzの前の“from”
00-
が欠落していると考えられるので,補っ
4-2
て解釈した。
0 : 2
5.2.2 セプタム高hの定義 追加 GTEMセルの場合のhの定 GTEMセルの場合の定義を補足,追加し
01
義の追加。 た。
4
7

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