ISO 24465:2023 表面化学分析 — 表面プラズモン共鳴装置の最小検出可能性の決定 | ページ 2

3.1 用語と定義

このドキュメントでは、次の用語と定義が適用されます。

ISO および IEC は、次のアドレスで標準化に使用する用語データベースを維持しています。

Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, 1. In particular, the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, 2 (see www.iso.org/directives ).

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents ).

Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISO's adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html .

This document was prepared by Technical Committee ISO/TC 201, Surface chemical analysis.

Introduction

The surface plasmon resonance (SPR) is the term used for the real time chemical contents analysing device. The chemical ingredient dissolved in buffer solvent causes the dielectric constant change compared to the buffer solvent. Changes in the dielectric constant of the solution modify the resonance condition of the surface plasmon coupling at the interface between metal (mostly gold or functionalized gold) and solution channel. So the reflection from the interface has the dip corresponding to the surface plasmon components which is evanescent. The change of the reflection spectrum is analysed by a charge coupled device (CCD) and the change of the spectrum dip represents the absolute amount of the surface existing chemical component at the interface. The determination of the dynamic range of the chemical analysis depends on the upper limit and lower limit of the detectability of the SPR device. The objective of this document is to provide the standardized definition of lower limit of detection and experimental protocol of measuring the lowest detectability of the SPR device. To avoid the complex and unwanted chemical interaction between the metal surface and the analyte, a single chemical solute method is presented, suitable for use by non-expert operators. That provides users with the fundamental capability of the SPR device.

1 Scope

This document describes a method for determining the minimum detectability of surface plasmon resonance device. This document is applicable to surface plasmon resonance devices of the white-light illumination type and the laser illumination type with the angle scanning capability.

2 Normative references

There are no normative references in this document.

3 Terms, definitions and abbreviated terms

3.2 Abbreviated terms

Bibliography