ISO 12718:2019 非破壊検査—渦電流検査—用語, 語彙 | ページ 5

3.3.9.1

コイルフィルファクター

<包囲コイル> コイルの内部断面積に対する被試験物の外部断面積の比

3.3.9.2

コイルフィルファクター

〈内部同軸コイル〉 試験対象製品の内部断面積に対するコイルの外部断面積の比

3.3.10

コイルの長さ

コイルの軸方向の長さ

3.3.11

コイル分離

2つのコイルの隣接する端の間の距離

3.3.12

コイル間隔

2つのコイル間の平均距離

注記 1: 表面プローブ (3.3.57) の場合、2 つのコイルの軸間の距離。

3.3.13

コイルの巻き数

コイルを作るために巻かれた導体の巻き数

3.3.14

コイル巻線

導体の 1 回以上の巻き

3.3.15

結合された送受信プローブ

インピーダンスサンプル

励起 (3.1.19) と受信の機能が同じコイルによって実行される プローブ (3.3.40 )

3.3.16

比較の取り決め

外部基準との 比較測定 (3.2.4) を 実行するための 配置 (3.3.6)

3.3.17

コンパレータサンプル

外部基準との 比較測定 (3.2.4) を 実行するための プローブ (3.3.40)

3.3.18

補償コイル

測定に対する望ましくない影響を補償するために使用される補助コイル

3.3.19

コア

<プローブ> コイルを支持し、磁束に影響を与える可能性のある物理的要素

3.3.20

電流駆動励磁

プローブのインピーダンスとは独立した電流によるプローブ ( 3.3.40) の励起 (3.1.19 )

3.3.21

ディファレンシャルアレンジメント

差動測定 (3.2.8) を 実行するための 配置 (3.3.6)

3.3.22

差分サンプル

差動測定 (3.2.8) を行うための プローブ (3.3.40)

注記 1:プローブだけでは測定のタイプを定義しません。

3.3.23

二重差分サンプル

二重差動測定 (3.2.11) を行うための プローブ (3.3.40)

注記 1:プローブだけでは測定のタイプを定義しません。

3.3.24

有効コイル径

円筒形テストコイルと同じ電磁効果を持つ理論上の円筒形コイルの直径

3.3.25

電気センター

プローブが基準欠陥上を移動したときの応答の特定の値に対応する渦電流 プローブ (3.3.40) の特性

注記 1:電気的中心は プローブ位置マーク (3.3.43) によって示されます。

注記 2:応答の特定の値は、たとえば、最大値またはゼロです。

3.3.26

包囲コイル

被試験製品を取り囲む 同軸プローブ（3.3.8）

3.3.27

励起場

主要なフィールド

励磁電流による磁場 (3.1.17)

3.3.28

フェライト

<非破壊検査> プローブの コア (3.3.19) or シールド (3.3.48) に使用される低導電率の強磁性材料

3.3.29

強磁性コアサンプル

磁束が強磁性 コア (3.3.19) によって誘導され強化される プローブ (3.3.40)

3.3.30

フォーカシングサンプル

プローブ (3.3.40) の特別な設計 [強磁性 コア (3.3.19) 、追加のコイルなど] により、感度および/または分解能を向上させるために磁場の焦点を合わせることができます。

3.3.31

フラックスゲートセンサー

渦電流プローブの 受信要素 (3.3.49) 、フラックス ゲート効果に基づいて誘導磁場に敏感

注記 1:フラックスゲート効果は、外部磁場の存在下で、強磁性 コア (3.3.19) を 2 つの反対方向に飽和させるのに必要な電流の強度の差です。違いは、測定されるフィールドによるものです。

3.3.32

巨大磁気抵抗センサー

渦電流プローブの 受信要素 (3.3.49) 、巨大磁気抵抗効果に基づいて誘導磁場に敏感

注記 1: 巨大磁気抵抗効果とは、強磁性材料と非強磁性材料の薄い積層層が磁場にさらされたときに生じる電気抵抗の大きな変化です。

3.3.33

ホール効果センサー

渦電流プローブの 受信要素 (3.3.49) 、ホール効果に基づく誘導磁場に敏感

注記 1:ホール効果は、電流が流れる平坦な導体 (または半導体) が電子の流れに垂直な磁場の中に置かれ、磁場に比例した起電力が導体全体に発生するときに発生します。 。

3.3.34

誘導センサー

誘導磁束の変化に敏感な渦電流プローブ ( 3.3.40) の受信要素 ( 3.3.49) (コイルまたは複数のコイル)

3.3.35

内部同軸プローブ

ボビンコイル

試験対象の製品に挿入される 同軸プローブ (3.3.8)

3.3.36

内部プローブ

テスト対象の製品に挿入された プローブ (3.3.40)

3.3.37

磁気抵抗センサー

磁気抵抗材料で作られた渦電流プローブの 受信要素 (3.3.49)

注記 1:磁気抵抗材料は強磁性材料であり、磁場にさらされると電気抵抗が変化します。

3.3.38

永久磁石サンプル

磁場が測定にとって重要な 1 つまたは複数の永久磁石を含む プローブ (3.3.40)

3.3.39

一次コイル

励振素子

被試験製品に励磁磁束を発生させるコイル

3.3.40

サンプル

渦電流トランスデューサー

励起要素 (3.3.39) と 受信要素 (3.3.49) を含む物理デバイス

3.3.41

サンプルアレイ

マトリクス状のコイルアセンブリの 配置（3.3.6）

3.3.42.1

サンプルフィルファクター

〈外部プローブ〉 試料の内部断面積に対する被検査物の外部断面積の比

3.3.42.2

サンプルフィルファクター

＜内部プローブ＞ 試験対象製品の内部断面積に対する サンプル（3.3.40） の外部断面積の比

3.3.43

サンプル位置マーク

渦電流 プローブ (3.3.40) ハウジング上のマーク。プローブの 電気的中心 (3.3.25) を表します。

3.3.44

擬似差分サンプル

疑似差動測定 (3.2.12) を行うための プローブ (3.3.40)

注記 1:プローブだけでは測定のタイプを定義しません。

3.3.45

参考サンプル

比較測定 (3.2.4) の外部基準を提供する サンプル (3.3.40)

3.3.46

反射アセンブリ

反射技術で使用されるコイル アセンブリ (3.5.26)

3.3.47

回転サンプル

回転する 表面プローブ(3.3.57)

3.3.48

画面

シールド

コイルまたは プローブ (3.3.40) 環境の一部または全体の電磁場の伝播を低減する材料

3.3.49

二次コイル

受信要素

コイルおよび/または 合成磁場を受け取る磁場強度測定装置 (3.1.34)

3.3.50

二次フィールド

誘導 渦電流によって生成される磁場 (3.1.12)

3.3.51

部分サンプル

チューブやバーのプロファイルなどの長い製品の周囲のセクターを縦方向に検査するように設計された プローブ (3.3.40)

3.3.52

個別の送受信プローブ

励起（3.1.19） と受信の機能が別個の異なる要素によって提供される プローブ（3.3.40）

3.3.53

シールドプローブ

1 つ以上の シールド (3.3.48) を備えた プローブ (3.3.40)

3.3.54

スプリットコイルサンプル

サンプル (3.3.40) は 2 つの部分で作成され、閉じて周囲を囲むサンプルを形成します。

3.3.55

SQUIDセンサー

磁場を検出するための1つまたは複数の超伝導量子干渉デバイス(SQUID)素子を含む渦電流 プローブ(3.3.40) の 受信素子(3.3.49)

3.3.56

減法磁束プローブ

プローブ（3.3.40） では、 励起（3.1.19） 磁束が各 励起要素（3.3.39） を通じて一方から他方を減算します。

3.3.57

表面サンプル

局所的な範囲をカバーする プローブ (3.3.40) 。そのハウジングは通常、試験される製品の表面に対して垂直に向けられています。

3.3.58

Tサンプル

プローブ (3.3.40) は 1 つの励磁コイルと 1 つの受信コイルを含み、その軸は互いに垂直です

3.3.59

トランスミッションアセンブリ

送信技術で使用されるコイル アセンブリ (3.5.43)

3.3.60

電圧駆動励起

プローブのインピーダンスに依存しない電圧による プローブ (3.3.40 ) の励起 (3.1.19 )

3.3.61

ヨークコイル

高透磁率の成形ヨーク（馬蹄形など）に巻かれたコイル

注記 1:馬蹄形など。

3.3.62

サンプルの影響範囲

テスト対象の製品を含む、導電性または磁性体の存在、変更、または移動が測定に影響を及ぼさない空間ゾーン

3.3.63

インタラクションゾーン

測定に影響を与えるテスト対象製品のゾーン

3.1.1

background noise

noise (3.1.26) originating from geometric and metallurgical variations in the product to be tested

Note 1 to entry: These effects may also be the subject of the measurement.

3.1.2

balance

compensation of the signal, corresponding to the operating point (3.5.20) , to achieve a predetermined value

Note 1 to entry: The predetermined value can be, for example, zero.

3.1.3

bandwidth

range of frequencies in which a signal is transmitted or amplified in a linear way

Note 1 to entry: Bandwidth is defined by the lower and upper cut-off frequencies which conventionally correspond to an attenuation of 3 dB.

Note 2 to entry: Bandwidth can be defined for any or all elements of the system, such as a filter (3.4.14) , a cable or an amplifier.

3.1.4

bucking signal

compensating signal

signal which is injected to balance a signal corresponding to the operating point (3.5.20)

3.1.5

characteristic frequency

f

conventional quantity used as a frequency unit

Note 1 to entry: Characteristic frequency is derived from the mathematical model using Bessel functions to describe the eddy current distribution (3.1.10) in a cylindrical bar. The value is dependent on the characteristics of the product which influence this distribution, e.g. electrical conductivity, magnetic permeability and diameter.

3.1.6

characteristic frequency ratio

dimensionless ratio of the excitation frequency (3.1.18) to the characteristic frequency (3.1.5) which enables the behaviour of electromagnetic quantities involved in the test to be generalized

Note 1 to entry: See law of similarity (3.1.24) .

3.1.7

coupling factor

ratio of the excitation (3.1.19) flux through the product to be tested to the total excitation flux, which measures the electromagnetic coupling (3.1.15) between the probe (3.3.40) and the product to be tested

3.1.8

demodulated signal

eddy current signal after demodulation

3.1.9

differentiated signal

output signal of a differential filter (3.4.8)

3.1.10

eddy current distribution

vector field of eddy current density

3.1.11

eddy current testing

non-destructive testing method using the electromagnetic effects of induced currents to evaluate the product to be tested

3.1.12

eddy currents

electric current induced in a conductive material by a varying magnetic field

3.1.13

effective depth of penetration

depth in the material beyond which the electromagnetic effects of eddy currents (3.1.12) can no longer be used for testing with a given system

3.1.14

effective permeability

complex quantity introduced to account for the weakening of the magnetic field strength within cylindrical objects due to the eddy current flow

Note 1 to entry: Effective permeability is used to calculate the output voltage from a secondary coil (3.3.49) of a coaxial probe (3.3.8) .

3.1.15

electromagnetic coupling

electromagnetic interaction between two or more circuits

Note 1 to entry: In eddy current examination, the product to be tested is a circuit.

3.1.16

electromagnetic testing

class of non-destructive test methods that uses electromagnetic energy having frequencies lower than those of infrared light

Note 1 to entry: For example, eddy current testing (3.1.11) and microwave methods are classed as electromagnetic testing.

3.1.17

excitation current

current in the primary coil (3.3.39) arrangement (3.3.6) (exciting element)

3.1.18

excitation frequency

nominal frequency of the excitation current (3.1.17)

3.1.19

excitation

induction

creation of eddy currents (3.1.12)

3.1.20

impedance plane diagram

graphical representation of the locus of points, indicating the variations in the impedance of a test coil as a function of the test parameters (3.5.39)

3.1.21

in phase demodulation

use of synchronous demodulation (3.1.38) to extract the active (resistive) component from the probe (3.3.40) signal

3.1.22

instrument noise

noise (3.1.26) originating in the eddy current instrument (3.4.11)

3.1.23

interference noise

noise (3.1.26) originating from sources external to the eddy current testing system (3.4.12)

3.1.24

law of similarity

law which permits the general description of electromagnetic phenomena for geometrically similar products

Note 1 to entry: The eddy current distribution (3.1.10) is the same provided that the characteristic frequency ratio (3.1.6) is the same.

3.1.25

loaded coil impedance

apparent impedance

impedance of a test coil coupled to a conductive product to be tested

3.1.26

noise

unwanted signal which can corrupt the measurement

3.1.27

normalized impedance plane diagram

locus of the points representing the normalized impedance of a coil when one or more parameters of a test vary

Note 1 to entry: The parameters to be considered are frequency, electrical conductivity, magnetic permeability, geometrical features or coupling factor (3.1.7) .

3.1.28

normalized reactance

reactance of the loaded coil divided by the reactance of the unloaded coil

Note 1 to entry: Normalized reactance is dimensionless.

3.1.29

normalized resistance

increase in the resistance between the loaded and unloaded coil condition divided by the unloaded coil reactance

Note 1 to entry: Normalized resistance is dimensionless.

3.1.30

phase angle of a signal

signal phase

angle, in the complex plane, between the vector associated with the signal and the vector associated with the phase reference (3.1.31)

Note 1 to entry: The orientation of the phase reference is defined in an operating procedure.

3.1.31

phase reference

direction in the complex plane display (3.4.5) chosen as the origin for the phase measurement

3.1.32

pulsed eddy currents

eddy currents (3.1.12) generated by a pulsed electromagnetic field

3.1.33

quadrature demodulation

use of synchronous demodulation (3.1.38) to extract the reactive component from the probe (3.3.40) signal

3.1.34

resultant magnetic field

magnetic field resulting from the vectorial addition of the primary and the secondary fields (3.3.50)

3.1.35

signature

signal locus (3.5.31) of a particular discontinuity or defect displayed in the complex plane

3.1.36

skin effect

concentration of electromagnetic fields and eddy current density near the surface of the product to be tested, which is a consequence of self- induction (3.1.19) and is dependent on frequency, conductivity and permeability

3.1.37

standard depth of penetration

δ

depth at which the magnetic field strength or the intensity of the induced eddy currents (3.1.12) has decreased to 37 % of its surface value

Note 1 to entry: The calculation is true for the simple case of a conductive half-space excited by a plane wavefront.

3.1.38

synchronous demodulation

demodulation of the probe (3.3.40) signal resulting from the reference being synchronous with the excitation (3.1.19) of the probe

3.1.39

unloaded impedance

empty coil impedance

impedance of a test coil clear of any conductive or magnetic material

3.2.1

absolute measurement

measurement of the deviation from a fixed reference point defined by the calibration procedure

Note 1 to entry: This reference point can be generated by a reference coil or voltage, or any other reference device.

3.2.2

absolute signal

output signal of an absolute system (3.4.1)

3.2.3

absolute value

value resulting from an absolute measurement (3.2.1)

3.2.4

comparative measurement

difference between two identical measurements, one of which is taken as a reference

3.2.5

comparative measurement with external reference

comparative measurement (3.2.4) in which the reference is separate from the product to be tested

3.2.6

comparative measurement with local reference

comparative measurement (3.2.4) in which the reference is part of the product to be tested

3.2.7

comparative signal

output signal of a comparative system (3.4.4)

3.2.8

differential measurement

difference between two measurements carried out at a constant distance between the measurement locations and on the same scanning path (3.5.29)

3.2.9

differential signal

output signal of a differential system (3.4.9)

3.2.10

differential value

value resulting from a differential measurement (3.2.8)

3.2.11

double differential measurement

difference between two differential measurements (3.2.8) carried out at a constant distance between the measurement locations and on the same scanning path (3.5.29)

3.2.12

pseudo-differential measurement

difference between two measurements carried out at a constant distance between the measurement locations, but not on the same scanning path (3.5.29)

3.3.1

absolute arrangement

arrangement (3.3.6) to perform an absolute measurement (3.2.1)

3.3.2

absolute probe

probe (3.3.40) for the purpose of making an absolute measurement (3.2.1)

Note 1 to entry: The probe alone does not define the type of measurement.

3.3.3

additive magnetic flux probe

probe (3.3.40) in which the excitation (3.1.19) fluxes add one to the other through each excitation element (3.3.39)

3.3.4

air cored probe

probe (3.3.40) without material which influences the electromagnetic field of the coils

3.3.5

angular sensitivity

influence of a surface probe (3.3.57) orientation with respect to the scanning path (3.5.29) on its response over a discontinuity

3.3.6

arrangement

construction

assembly and electrical connection of the exciting and receiving elements (3.3.49) contained in one or more probes (3.3.40) to perform a measurement with a given instrument

3.3.7

array probe

eddy current probe (3.3.40) including several elementary configurations of excitation (3.1.19) and receiving elements (3.3.49) , in which the relative positions of these elements is periodic

Note 1 to entry: The elements can be arranged, for example, in lines or matrices.

3.3.8

coaxial probe

feed through probe

probe (3.3.40) containing only coils which are coaxial to the product to be tested

3.4.1

absolute system

absolute arrangement (3.3.1) connected to a given instrument in order to perform an absolute measurement (3.2.1)

3.4.2

band pass filter

filter (3.4.14) with a finite bandwidth (3.1.3) , whose lower cut-off frequency is greater than zero

3.4.3

band stop filter

filter (3.4.14) with a finite bandwidth (3.1.3) which attenuates signals between the lower and upper cut-off frequencies

3.4.4

comparative system

comparative arrangement (3.3.16) connected to a given instrument in order to perform a comparative measurement (3.2.4)

3.4.5

complex plane display

display obtained by applying the in phase-demodulated eddy current signal to the horizontal axis and the quadrature-demodulated eddy current signal to the vertical axis

3.4.6

demagnetization unit

device to minimize the residual magnetism of the product to be tested before or after the test

3.4.7

demodulator

part of an eddy current instrument (3.4.11) which performs demodulation

3.4.8

differential filter

filter (3.4.14) providing the derivative of a signal in order to enhance brief signal variations by attenuating low frequencies

3.4.9

differential system

differential arrangement (3.3.21) connected to a given instrument in order to perform a differential measurement (3.2.8)

3.4.10

display area

<instrument> part of the complex plane which is displayed

3.4.11

eddy current instrument

part of an eddy current testing system (3.4.12) used to perform a measurement

Note 1 to entry: Generally, it consists of a generator, an amplifier, a demodulator (3.4.7) and a display unit.

3.4.12

eddy current testing system

system for test or measurement using eddy currents (3.1.12) , consisting at least of an eddy current instrument (3.4.11) , a probe (3.3.40) arrangement (3.3.6) and appropriate connecting cables

3.4.13

excitation power amplifier

power amplifier delivering an excitation (3.1.19) voltage or current which is independent of the probe (3.3.40) impedance

3.4.14

filter

<instrument> network that passes signals over a range of frequencies [ bandwidth (3.1.3) ] and attenuates signals at all other frequencies

3.4.15

generator unit

part of an eddy current instrument (3.4.11) which delivers the excitation (3.1.19) voltage or current

3.4.16

high pass filter

filter (3.4.14) with a finite bandwidth (3.1.3) extending from the lower cut-off frequency to a higher frequency

3.4.17

integrator

filter (3.4.14) providing the time integral of a signal, thus enhancing the slow variations of the signal

3.4.18

low pass filter

filter (3.4.14) with a bandwidth (3.1.3) extending from zero to the cut-off frequency

3.4.19

measurement channel

signal processing chain which outputs the value of a measured quantity

Note 1 to entry: A complex plane display (3.4.5) is vector information, and thus is the combination of two measurement channels.

3.4.20

measurement unit

part of an eddy current instrument (3.4.11) which processes signals from the probe(s) (3.3.40)

3.4.21

multichannel instrument

instrument featuring several measurement channels (3.4.19)

3.4.22

multifrequency instrument

instrument which performs the multifrequency technique (3.5.16)

3.4.23

multiparameter instrument

instrument which performs the multiparameter technique (3.5.18)

3.4.24

path synchronous display

display obtained by applying a signal proportional to the displacement of the probe (3.3.40) from a reference point along the scanning path (3.5.29) to the horizontal display axis

Note 1 to entry: Any chosen characteristic of the demodulated signal (3.1.8) from the probe is applied to the vertical display axis.

3.4.25

phase shifter

part of an eddy current instrument (3.4.11) which rotates the complex plane display (3.4.5)

3.4.26

probe pusher-puller unit

mechanical device for the movement of probes in the forward and reverse directions for the internal testing of tubes

3.4.27

rotating head

drive unit which rotates one or more surface probe(s) (3.3.57)

3.4.28

saturation coil

auxiliary coil producing a direct current magnetic field used to reduce the effects of permeability changes at the measurement location

3.4.29

saturation unit

device producing a direct current magnetic field used to reduce the effects of permeability changes at the measurement location

3.4.30

signal amplifier

part of an eddy current instrument (3.4.11) which amplifies the high-frequency signal from the probe

3.4.31

single channel instrument

instrument featuring only one measurement channel (3.4.19)

3.4.32

single frequency instrument

instrument which performs only single frequency examinations (3.5.32)

3.4.33

single parameter instrument

instrument which performs only single parameter examinations (3.5.34)

3.4.34

time synchronous display

display obtained by applying a sinusoidal signal to the horizontal display axis and any chosen characteristic of the demodulated signal (3.1.8) from the probe (3.3.40) to the vertical display axis

3.4.35

time gate

interval of time during which a time-varying signal is monitored

3.4.36

window

<eddy current testing> part of the complex plane in which the vector representation is monitored

3.5.1

approach technique

technique for sorting materials based on the signal locus (3.5.31) obtained as the probe (3.3.40) approaches the product to be tested

3.5.2

area of coverage

characteristic of the probe (3.3.40) which quantifies the coverage of the product to be tested

Note 1 to entry: The method of measurement of this quantity is defined in ISO 15548-2:2013 or a procedure.

3.5.3

balanced bridge technique

alternating current bridge technique in which variations in the properties of the material under test are sensed in terms of the bridge out-of-balance signal

3.5.4

drag effect

speed effect

effect produced by dynamic currents (3.5.5)

3.5.5

dynamic currents

additional eddy currents (3.1.12) induced by the relative movement between the probe (3.3.40) and the product to be tested

3.5.6

dynamic measurement

measurement made with relative movement between the probe (3.3.40) and the product to be tested

3.5.7

edge effect

geometric effect (3.5.9) produced by the edge of the product to be tested

3.5.8

end effect

geometric effect (3.5.9) with coaxial probes (3.3.8) produced by the end of a long product to be tested

3.5.9

geometric effect

influence on the eddy current signal of a change in the relative geometry between the probe (3.3.40) and the product to be tested occurring within the zone of interaction (3.3.63) of the probe

3.5.10

incremental permeability technique

technique by which an alternating magnetic field of high amplitude and low frequency is superimposed on the high-frequency excitation (3.1.19)

Note 1 to entry: The technique is only applied to ferromagnetic materials and used for characterization of material properties.

3.5.11

input effect

end effect (3.5.8) produced as the end of the product to be tested approaches a coaxial probe (3.3.8)

3.5.12

length of coverage

characteristic of the probe (3.3.40) which quantifies the coverage of the product to be tested in the direction of the scanning path (3.5.29)

Note 1 to entry: The method of measurement of this quantity is defined in ISO 15548-2:2013 or in a procedure.

3.5.13

lift off

geometric effect (3.5.9) produced by changes in the distance between the probe (3.3.40) and the product to be tested

3.5.14

material effect

influence on the eddy current signal of changes in the electromagnetic properties of the product to be tested occurring within the zone of interaction (3.3.63) of the probe

3.5.15

multifrequency examination

examination using the multifrequency technique (3.5.16)

3.5.16

multifrequency technique

technique in which the probe (3.3.40) is excited simultaneously or sequentially at different frequencies to provide eddy current signals at each frequency

3.5.17

multiparameter examination

examination using the multiparameter technique (3.5.18)

3.5.18

multiparameter technique

technique in which more than one feature of the eddy current signal is used for evaluation

Note 1 to entry: For example, amplitude or phase.

3.5.19

multifrequency combination

linear combination of demodulated signals (3.1.8) in the multifrequency technique (3.5.16)

Note 1 to entry: It is generally used to minimize one or more unwanted effects .

3.5.20

operating point

point on a complex plane display (3.4.5) corresponding to the nominal operating conditions

3.5.21

output effect

end effect (3.5.8) produced as the end of the product being tested leaves a coaxial probe (3.3.8)

3.5.22

phase setting

phase adjustment

use of the phase adjuster to achieve a defined operating condition, for example to optimize signal to noise (3.1.26) ratio

3.5.23

point of return technique

evaluation based on the position of the point of return of the signal locus (3.5.31) from an absolute system (3.4.1)

3.5.24

probe clearance

free space between the probe (3.3.40) and the surface of the product to be tested

3.5.25

pulse technique

technique using pulsed eddy currents (3.1.32)

3.5.26

reflection technique

technique in which the excitation element (3.3.39) and the receiving element (3.3.49) are not separated by the product to be tested

3.5.27

remote field technique

technique employing the remote field effect, generally used for the in-service inspection of ferromagnetic tubes

Note 1 to entry: The technique uses an internal separate transmit-receive probe.

Note 2 to entry: The exciting and the receiving elements (3.3.49) are separated by a distance at least twice the diameter of the tube.

3.5.28

rotating field technique

technique in which a rotating field is generated in the product to be tested by means of several exciting elements in fixed positions

3.5.29

scanning path

path described by the probe over the surface of the product to be tested

3.5.30

scanning plan

definition of the scanning path (3.5.29) and surface speed (3.5.38) to achieve the required degree of coverage of the product to be tested

3.5.31

signal locus

characteristic path of the point vector on a complex plane display (3.4.5) , resulting from the dynamic interaction of the probe (3.3.40) and the product to be tested

3.5.32

single frequency examination

examination using the single frequency technique (3.5.33)

3.5.33

single frequency technique

technique in which the probe (3.3.40) is excited at a single frequency

3.5.34

single parameter examination

examination using the single parameter technique (3.5.35)

3.5.35

single parameter technique

technique in which only one feature of the eddy current signal is used for evaluation

Note 1 to entry: For example, amplitude or phase.

3.5.36

sorting class

classification of the product to be tested within a range or ranges of the required characteristics

Note 1 to entry: For example, hardness, material composition or dimensions.

3.5.37

static measurement

measurement made with the probe (3.3.40) stationary relative to the product to be tested

3.5.38

surface speed

linear speed of the probe (3.3.40) relative to the product to be tested

3.5.39

test parameters

parameters which have to be defined to achieve the test result

3.5.40

testing configuration

arrangement (3.3.6) of the probe(s) in relation to the product to be tested

3.5.41

throughput speed

linear speed of the product to be tested relative to the eddy current testing system (3.4.12)

3.5.42

tilt effect

geometric effect (3.5.9) produced by changes in the angle of a surface probe (3.3.57) relative to the product to be tested

3.5.43

transmission technique

technique in which the excitation element (3.3.39) and the receiving element (3.3.49) are separated by the product to be tested

3.5.44

width of coverage

characteristic of the probe (3.3.40) which quantifies the coverage of the product to be tested in the direction perpendicular to the scanning path (3.5.29)

Note 1 to entry: The method of measurement of this quantity is defined in ISO 15548-2:2013 or in a procedure.

3.5.45

wobble

geometric effect (3.5.9) produced by an uncontrolled relative motion between the probe (3.3.40) and the product to be tested

Note 1 to entry: For example, vibration.

3.6.1

amplitude analysis

evaluation of the signal amplitude

3.6.2

analysis of signal dynamics

evaluation of the time dependence of the eddy current signal parameters

3.6.3

complex plane analysis

analytical method that correlates changes in the amplitude and phase of the demodulated signal (3.1.8) to changes in the electromagnetic coupling (3.1.15) and to the properties of the product to be tested

3.6.4

component analysis

evaluation of the magnitude of one component of the eddy current signal for a given phase reference (3.1.31)

3.6.5

dynamic analysis

analysis of time-dependent signals obtained by dynamic measurement (3.5.6)

3.6.6

elliptical display method

evaluation method based on the interpretation of the Lissajous patterns obtained by applying a signal representative of the excitation current (3.1.17) to the horizontal display axis and the signal from the probe (3.3.40) to the vertical display axis

3.6.7

gating technique

use of one or more gates to evaluate a signal

3.6.8

group analysis

statistical method for the sorting of materials into groups with different physical properties identified by eddy current testing (3.1.11)

3.6.9

harmonic analysis

analysis of the amplitude, phase or both, of the harmonic components of the probe (3.3.40) signal

3.6.10

modulation analysis

analysis of the demodulated eddy current signal

3.6.11

phase analysis

analysis in which a signal is evaluated by measuring its phase angle

3.6.12

regression analysis

evaluation method using a regression technique on the measured values, for example to sort into classes

3.6.13

sectorial analysis

amplitude analysis (3.6.1) performed in a sector of the complex plane

3.6.14

static analysis

analysis of time-independent signals obtained by static measurement (3.5.37)