ISO 25178-601:2025 幾何学的製品仕様 (GPS) — 表面テクスチャ:面積 — Part 601:接触 (スタイラス) 機器の設計と特性 | ページ 6

3.1

contact stylus instrument

measuring instrument that explores surfaces using a stylus (3.5) that physically moves along the surface to acquire a representation of the surface and provide the data for further computation (analytics)

Note 1 to entry: The method of using a contact stylus instrument is defined in ISO 25178-6, and is called “contact stylus scanning”.

Note 2 to entry: See Figure 2 for an information flow concept diagram for a contact stylus instrument.

3.2

probing system

<surface texture> component of the instrument consisting of a probe (3.3) , a stylus (3.5) and an optional stylus changing interface (3.7)

Note 1 to entry: See Figures A.2 to A.4 for examples of probing systems.

3.3

probe

<surface texture> device that generates the signals during scanning (3.4)

Note 1 to entry: In earlier standards, “transducer” was a separate term and a part of the probe.

3.4

scanning

<surface texture> moving the probe (3.3) over the surface to be measured while the stylus tip (3.6) contacts the surface

3.5

stylus

<surface texture> mechanical device consisting of a stylus tip (3.6) and a probe (3.3) arm

Note 1 to entry: For coordinate measuring machines, the term “shaft” is used instead of “probe arm”, see ISO 10360-1:2000, 4.1.

3.6

stylus tip

<surface texture> element that consists of a nominally right circular cone of defined cone angle and of a nominally spherical tip of defined radius

3.7

stylus changing interface

<surface texture> element that enables the change of the stylus (3.5)

Note 1 to entry: There are probing systems (3.2) without a stylus changing interface.

3.8

linear reference guide

component of the instrument that generates the intersection plane and the reference profile, in which the probing system (3.2) moves relative to the surface being measured according to a theoretically exact trajectory

3.9

areal reference guide

component(s) of the instrument that generate(s) the reference surface, in which the probing system (3.2) moves relative to the surface being measured according to a theoretically exact trajectory

Note 1 to entry: In the case of x- and y-scanning areal surface texture measuring instruments, the areal reference guide establishes a reference surface (see ISO 25178-2:2021, 3.1.10).

Note 2 to entry: The areal reference guide can be achieved through the use of two perpendicular linear reference guides (3.8) or one reference surface guide.

[SOURCE:ISO 25178-600:2019, 3.2.1, modified — Note 1 to entry has been modified and Note 2 to entry has been added.]

3.10

lateral scanning system

system that performs the scanning (3.4) of the surface to be measured in the (x, y) plane

Note 1 to entry: There are essentially four components to a surface texture scanning instrument system: the x-axis drive, the y-axis drive, the z-measurement probe (3.3) and the surface to be measured.

[SOURCE:ISO 25178-600:2019, 3.2.2. modified — Note 2 to entry has been deleted.]

3.11

drive unit x

component of the instrument that moves the probing system (3.2) or the surface being measured along the reference guide on the x-axis and returns the horizontal position of the measured point in terms of the lateral x-coordinate

[SOURCE:ISO 25178-600:2019, 3.2.3, modified — “x-drive unit” has been replaced by “drive unit x” as the term and “of the profile” has been deleted from the definition. Note 1 to entry has been deleted.]

3.12

drive unit y

component of the instrument that moves the probing system (3.2) or the surface being measured along the reference guide on the y-axis and returns the horizontal position of the measured point in terms of the lateral y-coordinate

[SOURCE:ISO 25178-600:2019, 3.2.3, modified — “x-drive unit” has been replaced by “drive unit y” as the term,"x-axis" has been replaced by"y-axis"," x-coordinate" has been replaced by"y-coordinate" and “of the profile” has been deleted from the definition. Note 1 to entry has been deleted.]

3.13

lateral position sensor

component of the drive unit that provides the lateral position of the measured point

Note 1 to entry: The lateral position is customarily measured or inferred by using, for example, a linear encoder, a laser interferometer or a rotary encoder coupled with a micrometer screw.

[SOURCE:ISO 25178-600:2019, 3.2.4]

3.14

critical dynamic of the probing system

v_dyn,c

maximum value of the scanning (3.4) speed above which the output signal is distorted

Note 1 to entry:: The critical dynamic of the probing system depends on the mechanical inertia of the moving parts and the surface to be measured.

Note 2 to entry: Below the critical dynamic of the probing system, a range of measurement speeds is generally acceptable.